Mission: To continually strive to attain excellence and establish international reputation in both teaching and research. Objective: To provide high level education and training in Mechanical and Manufacturing Engineering to engineers who will become leaders in their area, to achieve excellence in research and innovation and to advance the well-being of society.
Description: The scanning electron microscope is used to examine the surface topology of various materials using an electron beam, scanning the latter across the surface of the sample under examination. Study of materials with dimensions in the order of micrometers and nanometers.
Units: 1
Hosting Laboratory / Department: Micro- and nanofacturing Laboratory
The scanning electron microscope is used to examine the surface topology of various materials using an electron beam, scanning the latter across the surface of the sample under examination. Study of materials with dimensions in the order of micrometers and nanometers. The system can also be used to obtain information regarding the chemical composition of materials using Energy Dispersive Spectroscopy of X-ray - EDX), at localized areas of the surface.
Description: Powder X-ray Diffraction patterns are used to indentify the phase of the materials as well as to qualitatively and quantitatively analyse the materials
Units: 1
Hosting Laboratory / Department: Micro- and nanofacturing Laboratory
The UV-vis spectrophotometer is used to characterize the optical properties (by recording the absorption spectra) of various chemical compounds found in solution or at the solid phase.
Description: The FTIR spectrometer is used for the characterization of various chemical compounds found in the solid phase with the aim of obtaining information regarding their chemical composition.
Units: 1
Hosting Laboratory / Department: Polymers and Polymer processing Laboratories
The FTIR spectrometer is used for the characterization of various chemical compounds found in the solid phase with the aim of obtaining information regarding the chemical composition. For the analysis of a sample, it is necessary to prepare a pellet by mixing the chemical under analysis with KBr.
Description: Size exclusion chromatography (SEC) is based on the ability to separate compounds based on the size of molecules and finds applications in the characterization of polymers in respect to their average molar mass and molar mass distribution.
Units: 1
Hosting Laboratory / Department: Polymers and Polymer processing Laboratories
The SEC/GPC system consists of: Solvent storage bottles, sample introduction unit, high pressure pump, two chromatographic columns, detectors as well as a computer through which the experimental data is recorded and processed using a specialized software.
The basic operating principle of DMTA can be described by applying a sinusoidal force or displacement to the specimen and analyzing the mechanical response of the material. This technique can also be used to determine 1st and 2nd order thermal transitions in polymeric and composite materials. Studies can also be conducted using multiple frequencies and multiple temperatures.
Description: The Pulsed Laser Deposition (PLD) system is a commercial system from SURFACE systems + technology GmbH & Co KG equipped with a high-pulse-energy KrF excimer laser (Coherent COMPexPro 201; λ=248nm; maximum pulse energy=700mJ; pulse duration=25ns; maximum repetition rate=10Hz). The PLD chamber has a base pressure of 6^10-8 Torr, maximum temperature of 1000°C and a rotating/rastering four-target carrousel.
The Pulsed Laser Deposition (PLD) system can be used for the sequential deposition of thin films of any target with stoichiometric replication for the fabrication of multilayer devices.
Description: The Rigaku SmartLab X-ray diffraction (XRD) system features an automated, high-resolution θ-θ multipurpose X-ray diffractometer with expert system guidance software.
The Rigaku SmartLab X-ray diffraction (XRD) system enables the structural characterization of powder and thin film samples using diffraction, and in-plane scattering.
Electrical conductivity measurement based on 4-probe technique and Seebeck coeeficient measurement via steady state method; from room temperature up to 800οC
